发明名称 Semiconductor trench capacitor cell having a buried strap
摘要 A semiconductor trench capacitor structure having a first level aligned insulation structure and buried strap that extends from within the trench into the semiconductor substrate. The semiconductor trench capacitor structure may be fabricated by forming a shallow trench extending into both the trench capacitor and the semiconductor substrate, depositing and densifying an insulating material within the shallow trench and using a resist layer to define and etch a strap trench aligned with the wall of the shallow trench, depositing a layer of conductive material within the strap trench and followed by depositing an insulating material therein.
申请公布号 US5770876(A) 申请公布日期 1998.06.23
申请号 US19960748961 申请日期 1996.11.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LAM, CHUNG HON;LORD, DAVID K.;WRIGHT, JUDITH A.
分类号 H01L21/334;H01L21/8242;H01L29/94;(IPC1-7):H01L27/108 主分类号 H01L21/334
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