发明名称 Heterojunction field effect transistor having a InAlAs Schottky barrier layer formed upon an n-InP donor layer
摘要 A field effect transistor includes an undoped semiconductor layer formed on a semi-insulating InP substrate and lattice-matched with at least the semi-insulating InP substrate, a channel layer formed on the undoped semiconductor layer and consisting of a semiconductor layer having a larger electron affinity than that of the undoped semiconductor layer, a donor supply layer formed on the channel layer and consisting of an impurity-doped semiconductor layer having a smaller electron affinity than that of the channel layer, and a Schottky gate formation layer consisting of an undoped semiconductor layer formed on the donor supply layer. The donor supply layer consists of impurity-doped InP, and the Schottky gate formation layer consists of InAlAs.
申请公布号 US5767539(A) 申请公布日期 1998.06.16
申请号 US19970826026 申请日期 1997.03.28
申请人 NEC CORPORATION 发明人 ONDA, KAZUHIKO
分类号 H01L29/778;(IPC1-7):H01L31/030 主分类号 H01L29/778
代理机构 代理人
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