发明名称 |
METHOD AND DEVICE FOR ELIMINATING SEMICONDUCTOR WAFER FROM FLAT SUBSTRATE |
摘要 |
<p>PROBLEM TO BE SOLVED: To take out semiconductor wafers without damaging them by press- feeding liquid to the semiconductor wafers through a substrate, and separating the semiconductor wafers from the substrate by the action of this liquid to take up the semiconductor wafers by a take-up device at the time of eliminating the semiconductor wafers from the flat substrate (abrasive cloth or the like). SOLUTION: A plurality of toothed wafer carriers 3 each of which has a plurality of holes 4 formed to accommodate semiconductor wafers 5 are disposed on a polishing plate 2 covered with abrasive cloth 1. A tooth part formed at the periphery of each carrier 3 is meshed with inner and outer toothed rings 6, 7 to make each carrier 3 revolve while rotating on its axis. A plurality of liquid conductive holes 10 are formed in the polishing plate 2 so as to communicate with each outlet opening part 11 of the abrasive cloth 1. A circle 13 where one passage of each outlet opening part 11 is positioned, and each small circular track 9 corresponding to the movement of the center point of each semiconductor wafer 5 of the carrier 3 are made coincide with each other. The semiconductor wafers 5 can thereby be separated from the polishing plate 2 due to fluid pressure by feeding liquid so as to be taken up easily afterward.</p> |
申请公布号 |
JPH10156714(A) |
申请公布日期 |
1998.06.16 |
申请号 |
JP19970317274 |
申请日期 |
1997.11.18 |
申请人 |
WACKER SILTRONIC G FUER HALBLEITERMATERIALIEN AG |
发明人 |
PIETSCH GEORG;FEUCHTINGER ERNST |
分类号 |
B24B7/17;B24B37/08;B24B37/16;B24B37/26;B24B37/34;H01L21/687;(IPC1-7):B24B41/06 |
主分类号 |
B24B7/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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