发明名称 Thin film transistor with reduced leakage current
摘要 A thin film transistor for incorporation into an active-matrix liquid crystal display includes an active layer provided on a substrate. An electrode insulating layer is formed on the active layer, and a gate electrode including first and second gate layers is provided on the electrode insulating layer. The second gate layer overlies the first gate layer and has a width greater than the first gate layer. LDD regions, self-aligned with the second gate layer are provided in the active layer adjacent source and drain regions. The active layer further including a channel region located under the first gate layer and offset regions located under portions of the second gate layer extending beyond the first gate layer at opposite sides of the channel region. In the manufacture of the thin film transistor, an active layer is formed on a substrate; electrode insulating layer is formed on the active layer; oxidizable first gate electrode and a non-oxidizable second gate electrode of the same widths are stacked on the electrode insulating layer; low- concentration impurity ions are implanted in the active layer using the second gate electrode as a mask; sides of the first electrode, to form oxide layers that reduce the width of the first gate electrode; and implanting high-concentration impurity ions, using the second gate electrode and the oxide layers as implantation masks.
申请公布号 US5767530(A) 申请公布日期 1998.06.16
申请号 US19970938318 申请日期 1997.09.26
申请人 LG ELECTRONICS INC. 发明人 HA, YONG MIN
分类号 H01L21/336;(IPC1-7):H01L29/04 主分类号 H01L21/336
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