发明名称 Lower bandgap, lower resistivity, silicon carbide heteroepitaxial material, and method of making same
摘要 A silicon carbide semiconductor material; and method of making same, in which a doped film of 3C-silicon carbide is grown heteroepitaxially on a 6H-silicon carbide material. Growth occurs at 1200 DEG C. or less, and produces a heterolayer having a reduced bandgap, and hence reduced contact resistance, but which is fabricatable with the less expensive equipment commonly used to fabricate silicon based semiconductors.
申请公布号 US5766343(A) 申请公布日期 1998.06.16
申请号 US19950374473 申请日期 1995.01.17
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 DMITRIEV, VLADAMIR A.;IRVINE, KENNETH G.;SPENCER, MICHAEL;KELNER, GALINA
分类号 C30B25/02;H01L21/04;(IPC1-7):C30B29/36 主分类号 C30B25/02
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