Bare chip test carrier with an improved holding structure for a semiconductor chip

摘要

A chip tester for holding a semiconductor chip bonded via convex electrodes to a flexible substrate. The tester has a carrier body with a flat surface in contact with the flexible board. The carrier body overlies the flexible substrate so as to press down the flexible substrate. The tester also has a chip plate that underlies and contacts the semiconductor chip so as to urge the semiconductor chip toward the flexible substrate. At least a flat contact surface of the chip plate is made of an elastic material with a high elastic coefficient to obtain an adhesion with the semiconductor chip to prevent lateral displacement of the semiconductor chip. The tester also has a chip plate holder that underlies the flexible substrate and is positioned around both the semiconductor chip and the chip plate. The chip plate holder is spaced apart from the semiconductor chip so that the chip plate holder sandwiches the flexible substrate in cooperation with the carrier body.