发明名称 Method and apparatus for curing photoresist
摘要 A substrate photolithography system includes a substrate handling robot that pivots about a fixed point and transfers substrates between photoresist coater, a developer, and a heating/cooling unit, all of which are clustered about the robot. The end effector of the robot is capable of both vertical and lateral movement so that individual modules of the heating/cooling unit may be stacked. For heating/cooling, the substrate is placed in the heating/cooling unit in close proximity to a hotplate/chillplate and a thermally conductive, non-reactive gas, such as helium, is introduced into the airspace between the substrate and the hotplate/chillplate. The thermally conductive, non-reactive gas, is preheated/precooled before introduction into the airspace between the substrate and the hotplate/chillplate when the gas passes through a bore in the hotplate/chillplate. Additionally, the substrate is automatically aligned in a milled recession in the hotplate surface for future handling.
申请公布号 US5766824(A) 申请公布日期 1998.06.16
申请号 US19950508028 申请日期 1995.07.27
申请人 SEMICONDUCTOR SYSTEMS, INC. 发明人 BATCHELDER, WILLIAM T.;PARODI, MICHAEL L.;BICHE, MICHAEL R.
分类号 G03F7/16;G03F7/30;H01L21/00;H01L21/027;H01L21/687;(IPC1-7):G03F7/00 主分类号 G03F7/16
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