发明名称 |
Sensor test arrangement and method |
摘要 |
A first input voltage is applied to the input of a sensor (110), and a first output voltage is measured at the output (161). A second input voltage is then applied to the input of the sensor (110) , and a second output voltage is measured. Then the first and the second output voltages are compared to determine whether a predetermined relationship exists between them. <IMAGE>
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申请公布号 |
EP0846955(A1) |
申请公布日期 |
1998.06.10 |
申请号 |
EP19960402633 |
申请日期 |
1996.12.05 |
申请人 |
MOTOROLA SEMICONDUCTEURS S.A. |
发明人 |
PERRAUD, ERIC |
分类号 |
G01D18/00;G01R31/28;(IPC1-7):G01R31/28 |
主分类号 |
G01D18/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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