发明名称 Sensor test arrangement and method
摘要 A first input voltage is applied to the input of a sensor (110), and a first output voltage is measured at the output (161). A second input voltage is then applied to the input of the sensor (110) , and a second output voltage is measured. Then the first and the second output voltages are compared to determine whether a predetermined relationship exists between them. <IMAGE>
申请公布号 EP0846955(A1) 申请公布日期 1998.06.10
申请号 EP19960402633 申请日期 1996.12.05
申请人 MOTOROLA SEMICONDUCTEURS S.A. 发明人 PERRAUD, ERIC
分类号 G01D18/00;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01D18/00
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