发明名称 COMPOUND TYPE ANGLE BEAM PROBE
摘要 PROBLEM TO BE SOLVED: To achieve a total flaw detection, by arranging a plurality of vibrators at an interval by dimensions smaller than an effective beam width generated by a single vibrator in the axral direction of a cylindrical test object and shifting them by a value exceeding the width of the vibrators in the circumferen tial direction thereof. SOLUTION: The first group of vibrators 11a-11c and the second group of vibrators 12a-12c are arranged at an interval (n) shifted exceeding dimensions equivalent to width dimensions (m) of the vibrators 11a-11c and 12a-12c in the circumferential direction of a steel pipe 5 and at an interval P smaller than an effective beam width X1 in the axral direction of the steel pipe 5. Therefore, the effective beams X1-X3 formed by the vibrators 11a-11c in the axral direction of the steel pipe 5 are closely overlapped. In the automatic flaw detection, the probe and the steel pipe 5 are relatively moved so that the track of the effective beam width of the probe spirally scans the surface of the steel pipe 5. The first group of vibrators 11a-11c and the second group of vibrators 12a-12c may be arranged and shifted in the circumferential direction by the relative spiral movements of the probe 10 and the steel pipe 5.
申请公布号 JPH10153587(A) 申请公布日期 1998.06.09
申请号 JP19960315034 申请日期 1996.11.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 TANAKA HIROTSUGU
分类号 G01N29/04;G01N29/24;H04R17/00 主分类号 G01N29/04
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