发明名称 Semiconductor device having a Bi-CMOS transistor including an n-channel MOS transistor
摘要 In a semiconductor device and a method of manufacturing the same according to the invention, a p-type diffusion region for electrically connecting a back gate region and an electrode layer together is formed at a source region. Thereby, both of source region and p-type diffusion region are electrically connected to the electrode layer, so that the source region and the back gate region are maintained at the same potential. As a result, it is possible to provide the semiconductor device and the method of manufacturing the same which can suppress operation of a parasitic bipolar transistor formed in the semiconductor device even if a gate electrode has a large width.
申请公布号 US5763926(A) 申请公布日期 1998.06.09
申请号 US19960742120 申请日期 1996.10.31
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 YAMAMOTO, FUMITOSHI;TERASHIMA, TOMOHIDE
分类号 H01L21/8234;H01L21/8238;H01L21/8249;H01L27/06;H01L27/088;H01L27/092;H01L29/10;H01L29/41;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113 主分类号 H01L21/8234
代理机构 代理人
主权项
地址