发明名称 Method for making semiconductor device by coating an SOG film in amine gas atmosphere
摘要 A method for making a semiconductor device, includes steps of: forming a lower wiring on a semiconductor substrate; forming layer insulation film to cover the lower wiring; coating a surface of the layer insulation film with organic or inorganic SOG to form SOG film; heat-treating the SOG film; etching the SOG film to even a surface of the SOG film; forming an aperture reaching through the SOG film and the layer insulation film to the lower wiring; and filling the aperture with a conductive material to form a through-hole, wherein the coating step with the organic or inorganic SOG is conducted in amine system gas atmosphere.
申请公布号 US5763329(A) 申请公布日期 1998.06.09
申请号 US19970806666 申请日期 1997.02.26
申请人 NEC CORPORATION 发明人 KARIYA, ATSUSHI
分类号 B05C11/08;H01L21/31;H01L21/314;H01L21/316;H01L21/768;H01L23/532;(IPC1-7):H01L21/316 主分类号 B05C11/08
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