发明名称 Integrated arc and polysilicon etching process
摘要 A composite of an anti-reflective coating on polysilicon is accurately etched to form a polysilicon pattern by initially etching the ARC with gaseous plasma containing helium and/or nitrogen which is substantially inert with respect to polysilicon.
申请公布号 US5763327(A) 申请公布日期 1998.06.09
申请号 US19950554413 申请日期 1995.11.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BLASINGAME, TOM;GUPTA, SUBASH;BELL, SCOTT A.
分类号 H01L21/027;H01L21/311;H01L21/3213;(IPC1-7):B44C1/22 主分类号 H01L21/027
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