发明名称 System for real-time control of semiconductor wafer polishing including heater
摘要 A system for polishing a semiconductor wafer, the system comprising a platen subassembly defining a polishing area; a polishing head selectively supporting a semiconductor wafer and holding a face of the semiconductor wafer in contact with the platen subassembly to polish the wafer face; and means for heating the wafer while the wafer face is being polished.
申请公布号 US5762537(A) 申请公布日期 1998.06.09
申请号 US19970821936 申请日期 1997.03.21
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU, GURTEJ S.;DOAN, TRUNG TRI
分类号 B23Q15/013;B23Q15/12;B24B13/015;B24B37/04;B24B49/02;B24B49/04;B24B49/10;B24B49/12;B24B49/14;B24B57/02;G05B19/404;(IPC1-7):B24B29/00 主分类号 B23Q15/013
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