发明名称 Process for determining amount of argon contamination in oxygen and related apparatus therefor
摘要 A process for determining the amount of argon contamination present in high purity oxygen employing a combination apparatus including a gas chromatography apparatus, a pressure swing adsorption apparatus, and a conduit connecting the two apparatus to each other. The gas chromatography apparatus can be run with its column at about 70 DEG F. (21.1 DEG C.) or higher. A sample of the high purity oxygen is fed to the pressure swing adsorption apparatus, where a portion of the oxygen is removed, and then the thus modified sample is fed through the conduit to the gas chromatography apparatus. Since some of the oxygen has been removed with the pressure swing adsorption apparatus, the graph generated by the gas chromatography apparatus shows 2 resolved peaks, namely a small argon peak preceding a large oxygen peak, even though the column of the gas chromatography apparatus is not being cooled to cryogenic temperatures with a cryogen. Also, instead of first subjecting the high purity oxygen to the pressure swing apparatus, a sample is fed directly to the gas chromatography apparatus, which produces a graph that has only 1 large peak due to the oxygen which masks the small argon peak. By comparing the 2 graphs, an accurate determination can be made of the amount of argon contamination in the high purity oxygen.
申请公布号 US5762686(A) 申请公布日期 1998.06.09
申请号 US19960708407 申请日期 1996.09.04
申请人 SPECIAL GAS SYSTEM, INC. 发明人 BORZIO, RAYMOND A.
分类号 B01D53/04;B01D53/047;(IPC1-7):B01D15/08;B01D53/47 主分类号 B01D53/04
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