Analog self-test circuitry for a trunk interface

摘要

An integrated circuit is provided for a trunk interface which can test a trunk interface card. Switching circuitry couples tip and ring leads to signal detection circuitry which detects the typical ring and lead signal information. During testing, a test signal is generated which causes the detection circuitry to be coupled to sets of simulated ring and tip test signals which can test the functionality of the integrated circuit and the signal detection circuitry.