发明名称 Etching of Ti-W for C4 rework
摘要 A chemical etchant for the removal of titanium-tungsten containing structures from the semiconductors and a method for removing the titanium-tungsten. The etchant comprising a solution of hydrogen peroxide, a salt of EDTA, and an acid, the acid capable of preventing the deposition of tin oxide. The method of removal comprises first obtaining a wafer containing titanium-tungsten. Second, immersing the wafer having titanium-tungsten thereon for a predetermined period of time in an etchant bath comprising a solution of hydrogen peroxide, a salt of EDTA and an acid, the acid capable of preventing the deposition of tin oxide. Third, removing the treated wafer and rinsing the treated wafer and lastly, drying the wafer.
申请公布号 US5759437(A) 申请公布日期 1998.06.02
申请号 US19960740569 申请日期 1996.10.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DATTA, MADHAV;KANARSKY, THOMAS SAFRON;MATHAD, GANGADHARA SWAMI;SHENOY, RAVINDRA V.
分类号 C23F1/26;H01L21/3213;(IPC1-7):C09K13/00 主分类号 C23F1/26
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