发明名称 WAFER POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily flatten a surface to be polished of a wafer by preventing an uneven surface from being formed even when the wafer is polished with a head for chucking a wafer which is provided with an opening for allowing medium to blow over the wafer chucking surface. SOLUTION: A wafer polishing device for polishing a wafer 60 is provided with a head 50 which chucks the wafer 60 during polishing and is provided with a top plate 52 mounted on a head body 51 which is supported by a shaft 56. An opening 53 for allowing medium to pass is formed along the perimeter of a flat wafer chucking surface 52a of the top plate 52. The opening 53 leads to a passage 55 for medium which is formed inside the head 50. A guide ring 54 is also provided on the head 50 along the perimeter of the opening 53. The guide ring 54 forms a space 53a leading to the opening 53 and is provided with a prominence 54a toward the inside for facilitating the flow of the medium between the chucking surface 52a and the wafer 60.
申请公布号 JPH10150009(A) 申请公布日期 1998.06.02
申请号 JP19960308927 申请日期 1996.11.20
申请人 SONY CORP 发明人 SUZUKI ATSUSHI;SUZUKI TOSHIHIKO
分类号 B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/30
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