发明名称 Semiconductor acceleration sensor and testing method thereof
摘要 A semiconductor acceleration sensor has a silicon detecting body and a glass substrate. The silicon detecting body has a weight, a supporting frame, and beams for coupling the weight to the supporting frame, which are integrally processed from a silicon wafer. At least one semiconductor strain gauge is formed on a surface of a beam. The glass substrate is electrostatically joined with the supporting frame of the silicon detecting body. Furthermore, a gap portion is formed between a surface of the glass substrate and a lower surface of the weight.
申请公布号 US5760290(A) 申请公布日期 1998.06.02
申请号 US19950553721 申请日期 1995.10.23
申请人 FUJI ELECTRIC CO., LTD.;FUJITSU TEN LIMITED 发明人 UEYANAGI, KATSUMICHI
分类号 B81B3/00;B81C1/00;G01P15/08;G01P15/12;G01P21/00;H01L29/84;(IPC1-7):G01P21/00 主分类号 B81B3/00
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