发明名称 CAPACITOR OF SEMICONDUCTOR DEVICE EQUIPPED WITH SELECTIVE PROTECTING FILM PATTERN FORMED ON LOWER ELECTRODE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To protect the lower electrode of a capacitor against oxidation by a method wherein the lower electrode is formed on a semiconductor substrate, the protective film pattern is selectively formed on the lower electrode, and a dielectric film and an upper conductive layer are successively formed on the protective film pattern. SOLUTION: A lower electrode of a capacitor composed of a contact plug 130, a diffusion barrier layer pattern 140a, and a lower conductive pattern 150a is formed on a semiconductor substrate 100. An electroplating process is carried out making a selected metal serve as an anode and the substrate where the lower electrode pattern 150a and the diffusion barrier layer pattern 140a are formed serve as a cathode. By this setup, a protective film pattern 155 is formed of a selected film. The protective film pattern 155 which does not react on not only oxygen but also a dielectric film 160 formed on it is selected. The dielectric film 160 and an upper conductive layer 170 are formed for the formation of a capacitor.
申请公布号 JPH10150155(A) 申请公布日期 1998.06.02
申请号 JP19970231228 申请日期 1997.08.27
申请人 SAMSUNG ELECTRON CO LTD 发明人 HORII HIDEKI
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L27/04
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