发明名称 THIN FILM TRANSISTOR AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide a thin film transistor having a constitution, wherein polysilicon layers having different conductivity types are connected with the transistor and the generation of the unsatisfactory state due to the diffusion of impurities is prevented, and a method of manufacturing the transistor. SOLUTION: A drain 6, a channel 7 and a source 8 are integrally formed on the surface of a second oxide film 4 using polysilicon layers. The drain 6 is formed in such a way as to connect with a pad layer 3 (second polycrystalline semiconductor layer) via a contact hole 5 formed in such a way as to reach the upper surface of the pad layer 3. A boron implanted region BR is formed in the pad layer 3, which is positioned on the bottom of the hole 5 (open part).
申请公布号 JPH10150198(A) 申请公布日期 1998.06.02
申请号 JP19960306626 申请日期 1996.11.18
申请人 MITSUBISHI ELECTRIC CORP 发明人 MAEKAWA SHIGETO;IPPOSHI TAKASHI;IWAMATSU TOSHIAKI;MAEDA SHIGENOBU;KIN ITSUCHIYUU;TO KAZUHITO;KURIYAMA SACHITADA;ISHIGAKI YOSHIYUKI;UKITA MOTOMU;TSUTSUMI TOSHIAKI
分类号 H01L21/265;H01L21/336;H01L27/11;H01L27/12;H01L29/417;H01L29/45;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/265
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