Procedure for measuring specularity.

摘要

Procedure for measuring specularity. Procedure for measuring specularity, by which a monochromatic and very stable light source such as a Laser-type source falls directly onto a detector system, enabling this source to be measured and characterized precisely; next, this is made to fall onto a mirror and the reflected beam falls onto the said detector system thus also enabling the said reflected beam to be measured and characterized; next, the two measurements are related by means of statistical parameters, thus obtaining the characterization of the mirror forming the object of measurement. It is applied to the study and optical characterization of reflecting materials used for exploiting solar energy. <IMAGE>