METHOD FOR MEASUREMENT OF SKIN HISTOLOGY

摘要

The invention relates to a method for non-invasively measuring skin structure. Infrared radiation from a plurality of locations over an area of skin under investigation is measured so as to give an indication of the variation in papillary dermis thickness over said area, and the skin colour coordinates at a plurality of locations over the same area of skin is also measured. The data obtained is used to calculate corrected skin colour coordinates over the area corresponding to a predetermined papillary dermis thickness. The corrected skin colour coordinates so obtained are compared with a reference colour coordinate range for healthy skin of the same predetermined papillary dermis thickness. At an abnormal region, where the corrected skin colour coordinates lie outside the reference colour coordinate range, the depth of penetration of dermal melanin can be measured.