发明名称 Method and system for spatial filtering of an extended radiation source with chromatic aberration of imaging optics in single-element detector measurement for monitoring of the extended radiation source
摘要 <p>A method and system is disclosed in which the local variation of an extended radiation source is monitored with single-element detector. The chromatic aberration of the imaging optics induces the different transmittance curves for different wavelengths, and the different shape in the transmittance curve is used as a spatial filter which is multiplied to the chromatic intensity profile of the extended radiation source to detect the local variation in the intensity profile of the extended radiation source. The signal processing of the chromatic signals is implemented to detect the size variation and the environmental effects on the extended radiation source. A fiber is also used for remote operation. &lt;IMAGE&gt;</p>
申请公布号 EP0844465(A1) 申请公布日期 1998.05.27
申请号 EP19960402542 申请日期 1996.11.26
申请人 KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 KIM, CHEOL-JUNG;KIM, KWANG-SUK
分类号 G01J1/06;G01J1/42;(IPC1-7):G01J1/42 主分类号 G01J1/06
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