发明名称 Thin film transistor with an insulating film having an increased thickness on a periphery of a semiconductor island
摘要 A thin film transistor and a producing method therefor having a semiconductor layer which is formed in an islandish form and constitutes a channel forming region, a source region and a drain region, wherein the edge portion of the islandish semiconductor layer is so designed as to be gradually or monotonously thinned toward the edge thereof to prevent the gate insulating film covering the active layer from being thinned at the edge portion of the semiconductor layer. The gate insulating film is also smoothly formed to prevent an electric field concentration phenomenon at the edge portion./!
申请公布号 US5757030(A) 申请公布日期 1998.05.26
申请号 US19950439938 申请日期 1995.05.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 CODAMA, MITSUFUMI;KONDO, NORIAKI
分类号 H01L21/302;H01L21/3065;H01L21/336;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/302
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