发明名称 Touch probe with reseat position system
摘要 A touch probe which includes a fixed member, a movable member, a stylus, a bias means, and a reseat position system which permits the fixed member and the movable member to make contact with each other at pairs of contact points at positions which are spaced from one another. In the reseat position system, piezoelectric elements are provided which cause the fixed member and the movable member to move relatively in directions constrained by said pairs of contact points after a force applied to the movable member is removed. This realizes a touch probe which can secure high position reproducibility for a long period of time even if frictional forces act between the fixed member and the movable member./!
申请公布号 US5756886(A) 申请公布日期 1998.05.26
申请号 US19960725214 申请日期 1996.09.25
申请人 MITUTOYO CORPORATION 发明人 NISHIMURA, KUNITOSHI;HIDAKA, KAZUHIKO
分类号 G01B5/016;G01B7/016;(IPC1-7):G01B7/00 主分类号 G01B5/016
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