| 摘要 |
PROBLEM TO BE SOLVED: To shorten a test recording time by setting a recording beam intensity range of a narrow range containing a recording beam intensity value obtained front former test recording and selecting/testing recording beam intensity from its intensity range. SOLUTION: A modulation circuit 6 modulates light intensity of a laser beam 4 when test recording is performed on an optical disk 2 according to a test pattern. A memory 7 stores plural test patterns. A control circuit 10 obtains recording conditions according to respective test recording areas based on regenerative information obtained by a reproducing circuit 9. Further, the control circuit 10 inputs a signal from a temp. sensor 8, and reads out the test pattern data from the memory 7 when a temp. is changed by a prescribed value or above, and makes the modulation circuit 6 start test recording operation by sending that data to the circuit 6. An operation circuit 11 calculates the optimum light intensity in the whole recording area when the information is recorded based on the recording conditions obtained by the control circuit 10. |
