| 摘要 |
<p>PROBLEM TO BE SOLVED: To automatically adjust the position of a sample in an X-ray diffraction apparatus. SOLUTION: A sample 4 is cooled to be subjected to an X-ray diffraction measurement in a low temperature area in the X-ray diffraction apparatus. According to the method, the position of the sample 4 is automatically adjusted at this time. While predetermined three coordinate axes orthogonal to one another are set as X-axis, Y-axis and Z-axis, when the sample is moved in a predetermined range in a YZ direction with X rays being projected to the sample in parallel to the X-axis, a position where an intensity of diffraction rays is maximum is detected. The sample 4 is moved to the position (YZ position adjustment process). Then, the sample 4 is moved in an XZ direction within a predetermined range while the X rays are projected to the sample 4 in parallel to the Y-axis, and a position where the intensity of diffraction rays is maximum is detected. The sample 4 is moved to the position (XZ position adjustment process). The sample 4 is gradually cooled. The YZ position adjustment process and XZ position adjustment process are repeated until the sample 4 reaches a predetermined temperature, thereby, the position of the sample 4 is automatically adjusted.</p> |
