发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a dielectric-metal interface superior in contact condition by forming an oxide dielectric film on a metal film such that a conductive oxide thin film is formed in the condition of a poor oxygen compsn. as an intermediate layer and the oxide dielectric film is deposited by changing the thin film to a conductive one. SOLUTION: On the top of an alumina multilayer substrate 1, a lower electrode 2 and dielectric thin film 3 are formed, a Pt upper electrode 4 is formed thereon, and a pattern of the electrodes 4, 2 and dielectric film 3 is formed to provide a thin film capacitor. A thin film resistor 10 is formed on the top of a resin layer 8. A wiring 5 is formed by the Cu plating. On the multilayer substrate, the wiring 5, upper electrode 5 of the thin film capacitor, air-core inductor 6 and microwave monolithic integrated circuit 7 are interconnected through through-holes 9 by the Cu plating. This reduces the leak current of the thin film capacitor and produces a low-noise high-gain amplifier module.
申请公布号 JPH10135411(A) 申请公布日期 1998.05.22
申请号 JP19960286397 申请日期 1996.10.29
申请人 HITACHI LTD 发明人 SUGII NOBUYUKI;TAKAGI KAZUMASA;KOZUKA KOJI
分类号 H01L21/28;H01L21/822;H01L21/8242;H01L27/04;H01L27/108;H05K1/03;H05K1/16 主分类号 H01L21/28
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