发明名称 |
EXPOSURE MASK, ALIGNER, EXPOSURE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING ALIGNER, AND SEMICONDUCTOR DEVICE MANUFACTURED THEREBY |
摘要 |
PROBLEM TO BE SOLVED: To accurately adjust a gap between a wafer and a mask, even when the wafer has an irregular surface thickness. SOLUTION: A mask 1 has a membrane 4 formed thereon. Provided on the membrane 4 is a pattern to be transferred. The mask 1 is disposed so opposed to a wafer 8 held in a frame 6. A sensor 7 is provided in a region of the frame 6 holding the mask 1 for measuring a distance from the wafer 8. The distance sensor 7 measures the distance from the wafer 8 by projecting a laser beam 7a to the wafer 8 and using light reflected or scattered by the wafer. A mask frame 2 of the mask 1 is provided with a measuring hole 5 at a position, corresponding to the position of the sensor 7, so that the laser beam 7a from the sensor 7 is passed through the hole 5 and illuminated on the wafer 8, whereby the sensor measures the gap between the mask 1 and the wafer 8. |
申请公布号 |
JPH10135109(A) |
申请公布日期 |
1998.05.22 |
申请号 |
JP19960286842 |
申请日期 |
1996.10.29 |
申请人 |
CANON INC |
发明人 |
HARUMI KAZUYUKI;CHIBA YUJI |
分类号 |
G03F1/22;G03F1/44;G03F7/20;H01L21/027 |
主分类号 |
G03F1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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