发明名称 APPARATUS FOR MEASURING IMPEDANCE OF A RESONANT STRUCTURE
摘要 <p>Apparatus for measuring the value of a physical quantity which affects the impedance of an electrically resonant structure, said apparatus comprising an electrically resonant structure, an RF electrical energy source, a bidirectional RF transmission line connecting said source to said resonant structure, a directional coupler associated with said transmission line, said source providing an excitation signal to said structure, said directional coupler detecting the voltage or phase of a reflected signal returned from said resonant structure characterised in that the resonant structure is substantially non energy radiating and, at a given frequency of said source, has an impedance which varies continuously as a function of the value of said physical quantity. Typically the electrically resonant structure is at least partially composed of piezoelectric material.</p>
申请公布号 WO1998021598(A1) 申请公布日期 1998.05.22
申请号 GB1997003027 申请日期 1997.11.13
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