发明名称 MEMORY CHECK CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a memory check circuit which can detect an occurrence of fault without reading out the main data that is written in a main storage. SOLUTION: A parity checker 5 reads the data out of a check RAM 21 having a function equivalent to a RAM 2 when the data writing operation ends to the RAM 2. Then a fault of the RAM 21 is detected based on the data read out of the RAM 21 and the parity bit outputted from a parity generator 3. Thus a fault is detected when the data are written in the RAM 2.
申请公布号 JPH10124402(A) 申请公布日期 1998.05.15
申请号 JP19960274559 申请日期 1996.10.17
申请人 NEC CORP 发明人 BABA YUJI
分类号 G06F12/16 主分类号 G06F12/16
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