发明名称 DEPOSITION OF INSULATOR HAVING LOW PERMITTIVITY
摘要 PROBLEM TO BE SOLVED: To form an insulating layer between metal layers by supplying a source gas containing fluorine and carbon, along with a source gas containing a silicon oxide, into a dual-frequency high-density plasma reaction chamber, thereby depositing a fluorocarbon/silicon oxide on a substrate. SOLUTION: A substrate made of a thermally stable substance is placed in a dual-frequency plasma reaction chamber, and a source gas is fed through a distributor 24 into a vacuum chamber 20. Argon gas and oxygen are then injected into the vacuum chamber 20 and settled. After they are fixed at a desired temperature through a temperature regulator 35, perfluorobenzene containing fluorine and carbon is introduced as the source gas for fluorocarbon and hexamethyldicyloxane is introduced as the source gas for SiO2 , for example. After the pressure is settled, a specified frequency is applied to an upper electrode from a first RF modulator 24 of the reactor and a specified frequency is applied to a lower electrode from a second high-frequency modulator 34.
申请公布号 JPH10125674(A) 申请公布日期 1998.05.15
申请号 JP19970278460 申请日期 1997.10.13
申请人 LG SEMICON CO LTD 发明人 PARK JIN WON;LEE YOUNG HIE;KIM DONG SUN
分类号 C23C16/42;C23C16/30;C23C16/50;C23C16/517;H01L21/31;H01L21/312;H01L21/314;H01L21/316;H01L21/768;(IPC1-7):H01L21/316 主分类号 C23C16/42
代理机构 代理人
主权项
地址