发明名称 |
DEVICE AND METHOD FOR POSITION DETECTION |
摘要 |
PROBLEM TO BE SOLVED: To measure and adjust the cross angle and the relative rotary error of two laser beams for alignment accurately and speedily by calculating the position relationship between the two beams for a reference diffraction mark based on light information from a plurality of parts on the reference diffraction mark. SOLUTION: P polarization beams LB1 P and LB2 P that has passed through a polarization beam splitter(PBS) 19 become parallel luminous flux inclined by a specific angle by a lens 24, and enter an objective lens 29 via a lens 26. The beams LB1 P and LB2 P emitted from the objective lens 29 become parallel luminous flux that are inclined at angles symmetrical with a light axis AX relative to the grating arrangement direction of a wafer mark and enter at a specific cross angle from two directions and form an image. A phase detection system 32 input light beat signals SD and SR from photo detectors 31 and 23 to obtain a phase difference. A main control device MCS position a wafer W at a specific position based on the phase difference information from the phase detection system 32 and the position information from a laser interferometer 35. |
申请公布号 |
JPH10122815(A) |
申请公布日期 |
1998.05.15 |
申请号 |
JP19970231590 |
申请日期 |
1997.08.27 |
申请人 |
NIKON CORP |
发明人 |
OTA KAZUYA;UMAGOME NOBUTAKA;MIZUTANI HIDEO;KOMATSU KOICHIRO |
分类号 |
G01B11/00;H01L21/027;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|