Logic tester for digital integrated circuits - tests components connected in logic networks directly using current pulses

摘要

An arrangement for testing integrated digital electronic logic components uses a test device connected directly to the component leads which checks the component function whilst it is connected in a circuit with other logic components. The arrangement avoids complicated diagnostic interpretation of test results. Current pulses from the outputs of electronic switches are applied via at least two test contacts, e.g. probes (8, 9) to at least two inputs (A, B) of the device (1) to be tested so that the logical states of the inputs (A, B) are forced to values independent of their normal circuit values (i.e. logical '0' or '1'). At least one further prove (10) is connected to at least one output (C) of the component to determine the logical state of the output.