Component characteristics measurement circuit in an integrated semiconductor circuit system

摘要

The present invention provides a circuit enable to measure the component characteristics deviation of an integrated semiconductor circuit system. It has the structure that an input impedance and a feedback impedance are connected to an inverting amplifying circuit consisting of an odd number of stages of inverters. Enough impedance units are connected to make one of them the reference impedance and another the measurement object, known voltage is input to the inverting amplifying circuit, and its output is measured from the outside of the integrated semiconductor circuit system.