发明名称 Semiconductor device isolation region production
摘要 A process for producing a semiconductor device isolation region involves (a) forming a first insulation layer (11) with different widths in various regions on a substrate; (b) forming trenches (13a, 13b) with different widths in the substrate using the first insulation layer; (c) forming a second insulation layer in the trenches and on the first insulation layer; (d) exposing portions of the first insulation layer by etching the second insulation layer; and (e) wet etching the first insulation layer and the non-etched portions of the second insulation layer.
申请公布号 DE19717880(A1) 申请公布日期 1998.05.14
申请号 DE1997117880 申请日期 1997.04.28
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 LEE, SEUNG-HO, CHEONGJU, KR
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/765 主分类号 H01L21/76
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