发明名称 |
Semiconductor device isolation region production |
摘要 |
A process for producing a semiconductor device isolation region involves (a) forming a first insulation layer (11) with different widths in various regions on a substrate; (b) forming trenches (13a, 13b) with different widths in the substrate using the first insulation layer; (c) forming a second insulation layer in the trenches and on the first insulation layer; (d) exposing portions of the first insulation layer by etching the second insulation layer; and (e) wet etching the first insulation layer and the non-etched portions of the second insulation layer.
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申请公布号 |
DE19717880(A1) |
申请公布日期 |
1998.05.14 |
申请号 |
DE1997117880 |
申请日期 |
1997.04.28 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
LEE, SEUNG-HO, CHEONGJU, KR |
分类号 |
H01L21/76;H01L21/762;(IPC1-7):H01L21/765 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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