发明名称 |
Device for spatially resolved and non-destructive inspection of magnetic parameters |
摘要 |
<p>An induction sensor (1) having a positional resolution in the microstructure region and a Hall probe (14) record the magnetic parameters, such as a Barkhausen noise curve, to be stored in an interim store (40) at every point encountered by a positioning device (22) situated at a spacing controlled by a control circuit on the surface of a test specimen (30). The internal stress state and microstructure state of the test-specimen surface is imaged in an output device (45) with a resolution in the micrometre region by assigning the values corresponding to the measurement points to the characteristic values of the Barkhausen noise curve filtered by a discriminator (41). The eddy current impedance and the incremental permeability can furthermore be determined as a function of position with an impedance-measuring device (52). <IMAGE></p> |
申请公布号 |
EP0595117(B1) |
申请公布日期 |
1998.05.13 |
申请号 |
EP19930116597 |
申请日期 |
1993.10.14 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
发明人 |
ALTPETER, IRIS;THEINER, WERNER;GESSNER, MELANIE |
分类号 |
G01B13/12;G01L1/12;G01L5/00;G01N27/72;G01R33/12;G01R33/14;(IPC1-7):G01N27/72;G01N27/82;G01N27/90 |
主分类号 |
G01B13/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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