| 摘要 |
This invention presents a method for aligning a set of probes in a circuit testing apparatus with a set of pads of a circuit under test and the apparatus designed according to this method. The alignment includes the steps of selecting a first group G1 of probes from the set, such that all probes in group G1 have the same tip length L1 and the same beam length L2, and mounting each probe of group G1 on a first mounting block which has a first through-hole for each probe and a first removable portion which includes the first through-hole. During the mounting step the tip portion is placed in the through-hole, the mounting portion is attached to the first mounting block and the first removable portion is discarded. Then, a second mounting block is placed on the first mounting block and a second group G2 of probes selected from the set is mounted it in the same manner as group G1 on the first block. The blocks are aligning on top of each other by using guide holes and positioning holes in conjunction with a corresponding vertical fixing pin and a tiltable positioning pin.
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