发明名称 Surface polishing of silicon carbide electronic device substrate using CEO2
摘要 A silicon carbide substrate is dry-polished using chromium oxide Cr2O3, ion oxide Fe2O3, or cerium oxide CeO2 to obtain a good polished surface free of mechanical defects and with less crystal distortion. Films are then formed on the surface to create an improved electronic device.
申请公布号 US5750434(A) 申请公布日期 1998.05.12
申请号 US19950423841 申请日期 1995.04.18
申请人 FUJI ELECTRIC CO. LTD. 发明人 URUSHIDANI, TATSUO;OGINO, SHINJI
分类号 B24B1/00;C30B25/02;H01L21/304;H01L21/36;H01L29/24;H01L29/47;(IPC1-7):H01L21/306 主分类号 B24B1/00
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