发明名称 |
Speicherzelle und Verfahren zur Herstellung einer nichtflüchtigen Speicherzelle |
摘要 |
A single method is specified for the optional manufacture of a dual-gate cell, a split gate-cell, or a stacked-gate cell, in which a microtrench (8) is created in a first polysilicon layer (4). The microtrench (8) and an interpolydielectric (10) ensure electrical insulation of areas of the first polysilicon layer (4) from a second polysilicon layer (11). By adjusting a mask (12), any one of the three storage cells can be selected for manufacture. In addition, a dual-gate cell requiring exceptionally little space is created.
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申请公布号 |
DE19643185(A1) |
申请公布日期 |
1998.05.07 |
申请号 |
DE19961043185 |
申请日期 |
1996.10.18 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
KERBER, MARTIN, 81827 MUENCHEN, DE |
分类号 |
H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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主权项 |
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地址 |
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