发明名称 METHOD FOR MEASURING CELL THICKNESS OF LIQUID CRYSTAL CELL AND MEASURING APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To highly accurately measure a cell thickness of a liquid crystal cell including a twisted orientation liquid crystal by making it possible to apply the Senarmont principle to the measurement. SOLUTION: A light projected from a laser oscillator 11 is taken out as a linearly polarized light L0 with the use of a polarizing plate 4. The linearly polarized light is shed onto a liquid crystal cell 3 to be measured which includes a TN(twisted nematic) liquid crystal of a twist angle of 90 deg.. The light projected from the liquid crystal cell is input to a 1/4 wave length plate 6, and an azimuth angleθof a polarization axis L1 of the light out of the 1/4 wave length plate is detected. An apparent retardation R' is calculated from the azimuth angleθ. A true retardation R is converted from the apparent retardation R'. A thickness (d) of the cell is calculated from the true retardation (R=Δn.d:Δn is a difference of indices of refraction in a horizontal direction and a vertical direction of the liquid crystal).
申请公布号 JPH10115510(A) 申请公布日期 1998.05.06
申请号 JP19960270908 申请日期 1996.10.14
申请人 SEIKO EPSON CORP 发明人 MOMOSE YOICHI;HIRATA YOSHITOMO
分类号 G01B11/06;G01M11/00;(IPC1-7):G01B11/06 主分类号 G01B11/06
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