发明名称 INSPECTION METHOD FOR FLAW ON FACE TO BE INSPECTED
摘要 PROBLEM TO BE SOLVED: To obtain an inspection method in which a flaw existing on a face to be inspected is detected surely. SOLUTION: A flaw 1 to be inspected is moved in such a way that its part A to be imaged is moved with the passage of time, an image from an imaging means 2 is input in every arbitrary time, a flaw candidate point B is extracted from two input images whose imaging time is different from each other, and an error range is set around the flaw candidate point B in an image which is imaged later. Then, the flaw candidate point B in the image which is imaged before is moved according to the movement distance of the face, to be inspected, on the imaging means. A flaw candidate point which is close to the moved flaw candidate point B out of flaw candidate points existing inside the error range is used as a matching candidate point, the above processing operation is performed to a plurality of images which are imaged in a time-series manner, and the flaw candidate point B which is nominated as the matching candidate point is decided as a flaw existing on the face 1 to be inspected.
申请公布号 JPH10115595(A) 申请公布日期 1998.05.06
申请号 JP19960270276 申请日期 1996.10.11
申请人 NISSAN MOTOR CO LTD 发明人 SUZUKI YUTAKA;IMANISHI MASANORI;YOSHIDA KIYOSHI
分类号 G01B11/30;G01N21/88;G06T1/00;G06T7/00 主分类号 G01B11/30
代理机构 代理人
主权项
地址