IN-CIRCUIT TESTER, ADAPTER DEVICE OF THE IN-CIRCUIT TESTER AND CONTROLLING METHOD THEREOF,申请号JP19960272156-传众专利搜索

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发明名称	IN-CIRCUIT TESTER, ADAPTER DEVICE OF THE IN-CIRCUIT TESTER AND CONTROLLING METHOD THEREOF
摘要
申请公布号	JPH10115661(A)	申请公布日期	1998.05.06
申请号	JP19960272156	申请日期	1996.10.15
申请人	OKANO HIGHTECH KK	发明人	IKEDA YUICHI
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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