发明名称 Aftastende omgevings-elektronenmicroscoop.
摘要 PROBLEM TO BE SOLVED: To prevent an excessive scattering of primary electrons and deterioration in the vacuum of an electron gun chamber by providing a gas kind setting part. SOLUTION: A gas kind setting part 30 is provided, and when a gas kind which an operator uses is input thereto, the part 30 transmits an upper limit value of gas pressure to a gas pressure control part 20 while an upper limit value of secondary electron detector voltage to a secondary electron detector control part 18, these values being preliminarily stored as data in the part 30, and it is prevented that a gas pressure over these values is applied and an impressed voltage to the secondary electron detector is made. Accordingly, discharge between the secondary electron detector and a sample is prevented from generating, thereby generating no surface destruction of the sample 12 caused by the discharge and providing a proper contrast sample image.
申请公布号 NL1007374(A1) 申请公布日期 1998.05.06
申请号 NL19971007374 申请日期 1997.10.27
申请人 NIKON CORPORATION 发明人 KEITARO HARA
分类号 H01J37/16;H01J37/244;H01J37/28 主分类号 H01J37/16
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