发明名称 WAFER TAKE-OUT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a wafer take-out device in which many wafers pilingly housed in a cassette submerged in water can be surely taken out one by one. SOLUTION: At first, wafers W, W,... housed in a cassette 10 are raised up to a fixed position on the water surface independently of the cassette. Then, the wafer Wa positioned on the uppermost step is adsorptively held with a adsorption pad 55 in a state of stand-by over it. Next, the wafer Wa adsorptively held with the adsorption pad 55 is brought down, and submerged in a washing water tank 11. Washing liquid is jetted from a liquid jet nozzle 62 toward the wafer Wa adsorptively held with the adsorption pad 55 in the washing liquid. Hereat, when the wafers on and after the second step are adsorption on the underside of the wafer Wa adsorptively held with the absorption pad 55, they are shaked down by the liquid flow of the washing liquid jetted from the jet nozzle 62, and hence after shaking them down, the wafer Wa is raised and taken out.
申请公布号 JPH10114426(A) 申请公布日期 1998.05.06
申请号 JP19960269842 申请日期 1996.10.11
申请人 TOKYO SEIMITSU CO LTD 发明人 NAKAURA KENICHI
分类号 B65G49/07;H01L21/304;H01L21/677;H01L21/68;(IPC1-7):B65G49/07 主分类号 B65G49/07
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