发明名称 Optical spectrum measuring apparatus
摘要 <p>An optical spectrum measuring apparatus is disclosed which is able to accurately measure the optical spectrum without an influence and to measure the light intensity per unit frequency without an influence of the change of the bandwidth of the wavelength because of the measured wavelength. The diffraction grating (4) emits the diffracted light with an appropriate wavelength corresponding to the incident angle after diffracting the parallel light. The outgoing light slit (6) passes the diffracted light with a length shorter than the slit width. The AD converter (9) measures the intensity of the diffracted light passed through the outgoing light slit (6). CPU (12) controls the incident angle and the width of the slit. The memory of the bandwidth of the wavelength (14) stores the bandwidth of the passed wavelength and the measured light intensity is adjusted with the bandwidth of the passed wavelength. Also the bandwidth of the passed wavelength is converted to the frequency and the measured light intensity is adjusted by the bandwidth of passed wave frequency. &lt;IMAGE&gt;</p>
申请公布号 EP0840101(A1) 申请公布日期 1998.05.06
申请号 EP19970118305 申请日期 1997.10.22
申请人 ANDO ELECTRIC CO., LTD. 发明人 IWASAKI, TAKASHI
分类号 G01J3/04;G01J3/06;G01J3/28;(IPC1-7):G01J3/18 主分类号 G01J3/04
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