METHOD OF MEASURING A POTENTIAL DROP IN LAYERS NEAR ELECTRODES DURING ELECTROCHEMICAL TREATMENT,申请号PL19940305640-传众专利搜索

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发明名称	METHOD OF MEASURING A POTENTIAL DROP IN LAYERS NEAR ELECTRODES DURING ELECTROCHEMICAL TREATMENT
摘要
申请公布号	PL173721(B1)	申请公布日期	1998.04.30
申请号	PL19940305640	申请日期	1994.10.28
申请人	POLITECHNIKA WARSZAWSKA	发明人	LUBKOWSKI KONRAD
分类号	G01R29/24	主分类号	G01R29/24
代理机构		代理人
主权项
地址

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