发明名称 DIAGNOSTIC SYSTEM OF LOGICAL CIRCUIT
摘要 PURPOSE:To hold values of the latch group of a partial circuit to be diagnosed and take a diagnosis without the intervention of an operator by adding a partial circuit which cuts off a signal to the latch group and substituting this latch group with an equivalent circuit. CONSTITUTION:A partial circuit 29 consisting of an AND gate 25 which inhibits the input of a signal to an input latch 22 of a partial circuit 28 to be diagnosed, and a latch 26 is added to the partial circuit 28 to be diagnosed, and the partial circuits 28 and 29 are regarded as a test pattern generation uint. Then, the input latch 22 is substituted with the equivalent circuit which outputs an indefinite value ''X'' when the level of a timing signal supply line 27 is ''1''. If a single regenerative fault occurs on an input signal line 30 of an OR gate 33, that is detected from the propagation through the OR gate 33, the transmission of a timing signal T0 from an output latch 34, and the scanning-out operation of the output latch 34, so such a test pattern that a timing input signal line 37 of an equivalent circuit 32 is set to ''0'' is generated to attain the detection.
申请公布号 JPS60102021(A) 申请公布日期 1985.06.06
申请号 JP19830209023 申请日期 1983.11.09
申请人 HITACHI SEISAKUSHO KK 发明人 SATOU YOSHIO;ISHIYAMA TAKASHI;YAMADA MASARU;YAMADA NORIO
分类号 H03K19/00;(IPC1-7):H03K19/00 主分类号 H03K19/00
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