发明名称 X-ray examination device with C-shaped bracket
摘要 The device has a C-shaped bracket or frame (1). An X-ray emitter (2) and image generating system (3) are arranged at the ends of the frame (1). The frame (1) is adjustable in the circumferential direction and can be rotated about a horizontal axis (11). The frame is also height adjustable. The adjustment of the frame (1) is such that the central beam (8) of the X-ray emitter (2) runs through an isocentre (15). A light source (13) is arranged on the C-shaped frame (1). The light source emits a light beam (14) which runs through the isocentre (15). The light source is preferably arranged in the middle of the frame (1).
申请公布号 DE19717109(A1) 申请公布日期 1998.04.30
申请号 DE19971017109 申请日期 1997.04.23
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 HEINZE, UDO, DIPL.-ING. (FH), 91338 IGENSDORF, DE
分类号 A61B6/00;A61B6/08;(IPC1-7):A61B6/02;A61N5/10 主分类号 A61B6/00
代理机构 代理人
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