Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port,申请号GB19980004595-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port
摘要
申请公布号	GB9804595(D0)	申请公布日期	1998.04.29
申请号	GB19980004595	申请日期	1998.03.04
申请人	HEWLETT PACKARD COMPANY	发明人
分类号	G01R31/28;G06F11/22;G06F11/26;G06F11/36;H01L21/02;H01L21/66	主分类号	G01R31/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

IMPROVED SYNTHESIS OF BRANCHED ACYCLIC NUCLEOSIDES

Inhalation device and method for delivering variable amounts of different components

Method and device for providing compost bagging machine with perforated conduit

Machining center consisting of assembled modules

Multi-laser combustion surface treatment

MACHINE TOOL AND LUBRICANT JETTING STATE DETECTOR FOR MACHINE TOOL

Mainboard having a selective connection COM/VGA jack layout

NIR spectroscopy method for analyzing chemical process components

DUAL SAFETY-EDGE FOR AN OVERHEAD DOOR

DIRECT VISION PORT SITE DISSECTOR

APPARATUS FOR AERATING A PARTICULATE MATERIAL

HIV ENVELOPE-CD4 COMPLEXES AND HYBRIDS

CAPACITIVELY COUPLED POWER SUPPLY

PHOTOTREATMENT DEVICE FOR USE WITH COOLANTS AND TOPICAL SUBSTANCES

METHOD AND DEVICE FOR PRODUCING OPTICAL GLASSES

CAPACITIVELY COUPLED POWER SUPPLY

GRATING-STABILIZED SEMICONDUCTOR LASER

MONOMERS CONTAINING AT LEAST ONE BIARYL UNIT AND POLYMERS AND DERIVATIVES PREPARED THEREFROM